The XR-100, X-123 and OEM elements are offered with FastSDD®, standard SDD, Si-PIN and CdTe detectors. The Experimenter’s Kit with X-123FastSDD® is your quick start to best results.
http://amptek.com/products/fast-sdd-silicon-drift-detector/
Get the best performance with solid state detectors, proportional counters, photodiodes, PM tubes, CEMs, or MCPs by using Amptek Charge Sensitive Preamplifiers
http://amptek.com/hybrid-selection-guide/
The GAMMA-RAD5 is a powerful, portable gamma-ray spectrometer combining a complete NaI Scintillation Probe with a Digital Pulse Processor providing high quality detection and spectroscopic information.
http://amptek.com/products/gamma-rad5-gamma-ray-detection-system/
DP5 is a high performance DPP optimized for OEMs and lab users. DP5-X is a smaller lower power version of the DP5. The DP5G Kit is designed for use in scintillation spectroscopy systems.
http://amptek.com/products/dp5-digital-pulse-processor-and-mca/
Compromising nothing in performance, the MCA-8000D is a low power, light weight instrument which is exceptionally versatile and easy to use.
http://amptek.com/products/mca-8000d-digital-multichannel-analyzer/
The Mini-X is the first of its kind; a self-contained, packaged, miniature X-ray tube system, which includes the X-ray tube, the power supply, the control electronics and the USB communication to the computer. See also the Mini-X-OEM version.
http://amptek.com/products/mini-x-ray-tube/
With the acquisition of H.S. Foils in Finland, Amptek has brought detector and window design and manufacturing in house. We offer Premium Performance Detectors and new technology silicon nitride windows.
http://amptek.com/detector-window-development/
The SI-9300R Battery Analyzer is a complete solution for the characterization of high energy and power cells. The SI-9300R goes beyond battery cycling with Regenerative Technology, EIS on every channel, Multiple Current Ranges and Real-Time Data Analysis.
https://www.ameteksi.com/products/battery-analyzers/si-9300r
The SunPower CryoTel 1.5 cryocooler features a dual-opposed-piston pressure wave generator and a separate cold head to minimize exported vibration and acoustic noise, offering maximum efficiency, reliability and performance.
http://sunpowerinc.com/cryocoolers/cryotel-family/ds15/
ORTEC utilizes SunPower’s cutting-edge cryocooling technology for HPGe detectors incorporating LN2 recycling or electromechanical cooling to provide premium resolution.
http://www.ortec-online.com/products/radiation-detectors/germanium-hpge-radiation-detectors/detector-cooling
The ORTEC Profile Series of P-Type High Purity Germanium (HPGe) detectors match the crystal dimensions to specific applications for optimal counting geometry and measurement results.
http://www.ortec-online.com/products/radiation-detectors
ORTEC high and medium resolution handheld radioisotope identifiers (RIIDs) with high sensitivity crystals and intelligent algorithms, provide speed, accuracy and ease of use when detecting and identifying radioisotopes.
http://www.ortec-online.com/products/nuclear-security-and-safeguards
Solartron Analytical provides optimized systems for testing the combined electrical, thermal, and mechanical properties of insulators, dielectrics, and electronic materials.
https://www.ameteksi.com/products/materials-testing-systems/modulab-xm-mts
Solartron Analytical is the leader in Frequency Response Analyzer (FRA) technology. These FRAs are used for Electrochemical Impedance Spectroscopy (EIS) and are available as both stand-alone and integrated systems to test energy devices, solar cells and materials.
http://www.ameteksi.com/products/potentiostats/single-channel/apps-xm-series
Princeton Applied Research offers a scanning electrochemical workstation to add spatial resolution to electrochemical measurements. Through techniques, such as SECM and STLYUS probe, the VersaSCAN allows users to map the localized electrochemical responses of their systems.
https://www.ameteksi.com/products/scanningelectrochemicalsystems
Princeton Applied Research offers a range of innovative products for users that need both the flexibility and functionality of high-performance potentiostats in a single channel, bipotentiostat, or multichannel configuration.
http://www.ameteksi.com/products/potentiostats/multichannel/parstat-mc
Signal Recovery is the leader in Lock-in Amplifier technology. The ability to extract small signals in the presence of overwhelming background noise, benefits end-users directly and through our different OEMs partners.
http://www.ameteksi.com/products/lock-in-amplifiers/7270-general-purpose-dsp-lock-in-amplifier
The CAMECA EIKOS provides accessibility to Atom Probe Tomography with ease of use and a low cost of ownership, enabling new understanding of materials for research and faster development of products for metallurgical applications.
www.cameca.com/eikos
The CAMECA AKONIS is a fully automated Secondary Ion Mass Spectrometer for wafer compositional analysis directly in the semiconductor fabrication lines. A SEMI-compliant platform, accessible to non-experts, providing high throughput, high precision detection for Epitaxial (SiGe, SiP) and implant process monitoring.
https://www.cameca.com/products/sims/akonis
The CAMECA IMS 1300-HR³ is a new generation Ultra High Sensitivity SIMS offering unmatched analytical performance for stable isotope, trace element and small particle analysis in geo- and cosmochemistry, geochronology and nuclear safeguards.
www.cameca.com/ims 1300-hr3
The CAMECA IMS 7f-Auto is a versatile SIMS with benchmark depth profiling and imaging capabilities used for efficient development of novel semiconductor, PV and LED devices, as well as for materials research and environmental studies.
www.cameca.com/ims 7f-auto
The CAMECA LEAP 5000 Atom Probe delivers 3D compositional imaging and analysis with near atomic resolution, ppm sensitivity and high throughput across a wide variety of metals, semiconductors and insulators.
www.cameca.com/leap5000
The CAMECA NanoSIMS 50L is a high sensitivity ion microprobe with 50nm spatial resolution for a wide application spectrum: intra-cellular metabolic activity measurements in micro-organisms or human cells, isotopic analysis of sub-micron grains in cosmic dust, trace element imaging in nanotechnology.
www.cameca.com/nanosims
The CAMECA SXFive-TACTIS EPMA performs precise quantitative microanalysis and x-ray mapping of major and trace elements at high spatial resolution in geochemistry, mineralogy, physical and nuclear metallurgy, material sciences (including cements, glass, ceramics …)
www.cameca.com/sxfive-tactis
Vitesse is a time-of-flight inductively coupled plasma mass spectrometer that has been purpose designed to be the ultimate tool for high speed multi-element applications such as laser ablation imaging and nanoparticle analysis.
https://www.nu-ins.com/products/hr-mc-icp-ms/vitesse
Sapphire from Nu is a next generation Multi-Collector ICP-MS. The collision cell capable instrument builds on the field proven Nu Instruments Multi-Collector ICP-MS platform (with over 170 installed instruments worldwide) to add unrivalled capabilities.
https://www.nu-ins.com/products/hr-mc-icp-ms/sapphire
The Astrum is designed to test high purity materials with the best detection limits. The primary application of the Astrum GD-MS is the characterisation of high purity conductive and non-conductive materials.
https://nu-ins.com/products/gd-ms/astrum
The Attom ES from is a double focussing inductively coupled plasma mass spectrometer that has been purpose designed to be the ultimate tool for rapid and precise isotope ratio and quantitative analysis of trace elements in solid and liquid matrices.
https://nu-ins.com/products/hr-mc-icp-ms/attom-es
The Noblesse HR has the ability to determine the isotope ratios of the noble gases with accuracy, flexibility and reliability. Noblesse HR can resolve most isobaric interferences to the noble gases, giving more accurate results.
https://nu-ins.com/products/noble-gas/noblesse-hr
The Perspective geometry forms the basis for two state of the art IRMS instruments. Designed for flexibility, high performance and reliability, it has the ability to achieve precise measurements from the smallest sample.
https://nu-ins.com/products/irms/perspective
Plasma 3 is designed to provide the best possible precision and accuracy for simultaneous isotopic ion detection. The patented Zoom Lens enables the simultaneous measurement of the isotopes of elements from lithium to the actinide series.
https://nu-ins.com/products/hr-mc-icp-ms/plasma3
TIMS is a Thermal Ionisation Mass Spectrometer. The instrument has been developed using our field-proven variable dispersion multi-collector technology to improve the versatility and overall performance of this long established analytical technique.
https://nu-ins.com/products/tims/tims
Clarity™ is the world's first commercial Electron Backscatter Diffraction (EBSD) specific detector based on Direct Detection (DD) technology. This revolutionary approach provides unparalleled pattern quality and sensitivity with no detector read noise and no distortions for optimal performance, opening new doors into the evolution of EBSD pattern detection and analysis.
https://www.edax.com/products/ebsd/clarity-ebsd-analysis-system
The Lambda™ Wavelength Dispersive Spectrometry (WDS) Analysis System combines the EDAX WDS software with state-of-the-art spectrometers for improved accuracy and precision, guaranteeing the best results for your materials analysis.
https://www.edax.com/products/wds/lambda-wds-analysis-system
Element SDDs are solutions based detectors, which excel at basic analysis. Focused primarily on serving the needs of the industrial market segment, they provide application specific software and analysis that can quickly provide answers in the industrial environment.
www.edax.com/Products/EDS/Detectors/Element.aspx
The game changing advancements in the Octane Elite SDD Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity, light element detection, and low kV microanalysis.
www.edax.com/products/eds/detectors/octane-elite-sdd-series.aspx
With minimal sample preparation and no coating required, Orbis Micro-XRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.
www.edax.com/Products/Micro-XRF/Orbis/Index.aspx
The SMX-ILH XRF system is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of rigid and flexible substrates. This system allows the movement of coated material through the measuring enclosure for full panel analysis either in static or across the gradient locations through a motorized, programmable single or dual integrated measuring module.
www.edax.com/products/X-ray%20Metrology/SMX-ilh.aspx
The Octane Elect Silicon Drift Detector is tailored for users who need higher performance and more options than those offered by entry-level detectors. It offers both increased functionality and high resolution at an optimal value. The Octane Elect SDDs provide remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis.
http://www.edax.com/products/eds/octane-elect-eds-system.aspx
The Elite T is the next generation EDS system for transmission electron microscopy (TEM) utilizing a fast SDD with state-of-the-art integrated electronics. The unique geometry and powerful quantification routines of the Elite T provide optimized analysis solutions for all TEM applications.
https://www.edax.com/products/eds/elite-t-eds-system
The Velocity™ EBSD camera offers high-speed EBSD mapping with the highest indexing performance on real world materials. Powered by a CMOS sensor, the Velocity™ combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.
https://www.edax.com/products/ebsd/velocity-ebsd-camera
Headquarters: Pasadena, CA, USA
www.forzasilicon.com
Custom Image Sensor & IC Design Services: Architecture Study, Technology & Specification Development, Circuit Design & Layout, Parasitic Extraction & Verification, and Tapeout to Foundry.
http://www.forzasilicon.com/production-services/
Integrated Production Services: Electro/Optical Test, Prototype & Wafer Probe Development, Qualification, Yield Optimization, and Production Test & Delivery.
http://www.forzasilicon.com/production-services/
Headquarters: Pleasanton, CA, USA
www.gatan.com
The K3® camera is the complete and latest expression of Gatan’s deep experience in the delivery of real-time, single-electron counting direct detection cameras for the most demanding low-dose electron microscopy applications.
https://www.gatan.com/K3
The world’s first counting, high-speed, large-format camera for in-situ microscopy. Extending the resolution revolution from K3 into material science, you can now count single electrons in real-time with an unprecedented temporal resolution to collect the ultimate in-situ data.
https://www.gatan.com/K3IS
Built around new and exclusive detector systems, the Continuum™ series delivers outstanding detector speed and quality for both electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) applications.
https://www.gatan.com/Continuum
Built upon a groundbreaking optical design, Monarc® dramatically boosts sensitivity and spectral resolution, empowering the most complete cathodoluminescence (CL) analysis to date with unique wavelength- and angle-resolved capabilities.
https://www.gatan.com/Monarc
The SPECTRO ARCOS high-resolution ICP-OES spectrometer — designed for use in the most demanding elemental analysis applications in industry, science, and academia — offers fast and convenient selection of axial plasma or radial plasma observation in a single instrument.
www.spectro.com/arcos
The SPECTROLAB S Arc/Spark optical emission spectrometer for high-end metal analysis is ideally suitable for metals industry research and development (R&D) and process/quality control.
www.spectro.com/lab-s
The market leading mobile metal analyzer SPECTROTEST is the perfect choice for many applications in the metal producing, processing, and recycling industries — especially when exact metal analysis is required, when materials are difficult to identify or when there is a large number of samples to be tested.
www.spectro.com/test
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. They offer metals or nonmetals identification in seconds and provide repeatable, laboratory-quality results.
www.spectro.com/xsort
The SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer excels at critical tasks from rapid screening elemental analysis for environmental and waste sampling to demanding applications in research, academia, and geological science.
www.spectro.com/xepos
The Flex4k, designed for cinematographers, has a special on-camera interface, frame-rate flexibility, noise reduction technology, and extremely sharp image recording.
www.phantomhighspeed.com/Flex4k
The Miro C Series cameras are perfect for microscopy, hard-to-reach places, and high-resolution on-board automotive testing. Features such as battery back-up and data storage options enhance functionality.
www.phantomhighspeed.com/MiroC
Phantom T-Series cameras deliver high end features, such as premium 4-Mpx imaging and CineMag compatibility in a compact mid-range platform. Workflow features make the camera easy to use in a harsh, remote environments.
www.phantomhighspeed.com/TSeries
Designed for automotive, aerospace, and ballistic testing with small and volatile environments.
Data security is the primary focus for this tiny camera.
www.phantomhighspeed.com/n5
The Ultrahigh-Speed Phantom cameras include the world’s fastest 4Mpx camera, the v2640. They are excellent tools for researchers, scientists, and engineers.
www.phantomhighspeed.com/Ultra
Phantom VEO cameras are designed to work in any research setting. Rugged, compact, and with over 10 models ranging from 1-9 Megapixel resolution, there is a VEO model to fit most high-speed applications.
www.phantomhighspeed.com/VEO
Machine Vision cameras for use in biomedical, road and rail, and industrial settings. CXP protocols and the Phantom DVR make data management simple.
www.phantomhighspeed.com/MachineVision
The CAMECA EIKOS provides accessibility to Atom Probe Tomography with ease of use and a low cost of ownership, enabling new understanding of materials for research and faster development of products for metallurgical applications.
The SPECTRO ARCOS high-resolution ICP-OES spectrometer — designed for use in the most demanding elemental analysis applications in industry, science, and academia — offers fast and convenient selection of axial plasma or radial plasma observation in a single instrument.
The Astrum is designed to test high purity materials with the best detection limits. The primary application of the Astrum GD-MS is the characterisation of high purity conductive and non-conductive materials.
The game changing advancements in the Octane Elite SDD Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity, light element detection, and low kV microanalysis.
Signal Recovery's lock-in amplifiers recover signals in the presence of overwhelming background noise or can provide high resolution measurements of relatively clean signals over several orders of magnitude and frequency.
The Attom ES from is a double focussing inductively coupled plasma mass spectrometer that has been purpose designed to be the ultimate tool for rapid and precise isotope ratio and quantitative analysis of trace elements in solid and liquid matrices.
Clarity™ is the world's first commercial Electron Backscatter Diffraction (EBSD) specific detector based on Direct Detection (DD) technology. This revolutionary approach provides unparalleled pattern quality and sensitivity with no detector read noise and no distortions for optimal performance, opening new doors into the evolution of EBSD pattern detection and analysis.
The SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer excels at critical tasks from rapid screening elemental analysis for environmental and waste sampling to demanding applications in research, academia, and geological science.
The CAMECA IMS 1300-HR³ is a new generation Ultra High Sensitivity SIMS offering unmatched analytical performance for stable isotope, trace element and small particle analysis in geo- and cosmochemistry, geochronology and nuclear safeguards.
Sapphire from Nu is a next generation Multi-Collector ICP-MS. The collision cell capable instrument builds on the field proven Nu Instruments Multi-Collector ICP-MS platform (with over 170 installed instruments worldwide) to add unrivalled capabilities.
The market leading mobile metal analyzer SPECTROTEST is the perfect choice for many applications in the metal producing, processing, and recycling industries — especially when exact metal analysis is required, when materials are difficult to identify or when there is a large number of samples to be tested.
The CAMECA NanoSIMS 50L is a high sensitivity ion microprobe with 50nm spatial resolution for a wide application spectrum: intra-cellular metabolic activity measurements in micro-organisms or human cells, isotopic analysis of sub-micron grains in cosmic dust, trace element imaging in nanotechnology.
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. They offer metals or nonmetals identification in seconds and provide repeatable, laboratory-quality results.
The Noblesse HR has the ability to determine the isotope ratios of the noble gases with accuracy, flexibility and reliability. Noblesse HR can resolve most isobaric interferences to the noble gases, giving more accurate results.
Built around new and exclusive detector systems, the Continuum™ series delivers outstanding detector speed and quality for both electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) applications.
With minimal sample preparation and no coating required, Orbis Micro-XRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.
The CAMECA AKONIS is a fully automated Secondary Ion Mass Spectrometer for wafer compositional analysis directly in the semiconductor fabrication lines. A SEMI-compliant platform, accessible to non-experts, providing high throughput, high precision detection for Epitaxial (SiGe, SiP) and implant process monitoring.
The SPECTROLAB S Arc/Spark optical emission spectrometer has the world’s first CMOS-based detector system that’s perfected for high-end metal analysis — thanks to SPECTRO’s proprietary CMOS+T technology. From trace elements to multi-matrix applications, it provides extremely fast, highly accurate, exceptionally flexible analysis.
The Perspective geometry forms the basis for two state of the art IRMS instruments. Designed for flexibility, high performance and reliability, it has the ability to achieve precise measurements from the smallest sample.
Solartron Analytical provides optimized systems for testing the combined electrical, thermal, and mechanical properties of insulators, dielectrics, and electronic materials.
The CAMECA SXFive-TACTIS EPMA performs precise quantitative microanalysis and x-ray mapping of major and trace elements at high spatial resolution in geochemistry, mineralogy, physical and nuclear metallurgy, material sciences (including cements, glass, ceramics …)
The SMX-ILH XRF system is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of rigid and flexible substrates. This system allows the movement of coated material through the measuring enclosure for full panel analysis either in static or across the gradient locations through a motorized, programmable single or dual integrated measuring module.
TIMS is a Thermal Ionisation Mass Spectrometer. The instrument has been developed using our field-proven variable dispersion multi-collector technology to improve the versatility and overall performance of this long established analytical technique.
The Octane Elect Silicon Drift Detector is tailored for users who need higher performance and more options than those offered by entry-level detectors. It offers both increased functionality and high resolution at an optimal value. The Octane Elect SDDs provide remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis.
Built upon a groundbreaking optical design, Monarc® dramatically boosts sensitivity and spectral resolution, empowering the most complete cathodoluminescence (CL) analysis to date with unique wavelength- and angle-resolved capabilities.
The Velocity™ EBSD camera offers high-speed EBSD mapping with the highest indexing performance on real world materials. Powered by a CMOS sensor, the Velocity™ combines fast acquisition with high sensitivity and low noise performance for optimal collection and data quality.
Vitesse is a time-of-flight inductively coupled plasma mass spectrometer that has been purpose designed to be the ultimate tool for high speed multi-element applications such as laser ablation imaging and nanoparticle analysis.
Our analytical systems include elemental analysis systems for bulk, micro and nanoscale applications as well as structural analysis & visualization systems and energy storage and test analyzers.
Our technologies, products, and services are instrumental in materials analysis for radioisotopic content. Key industry segments include nuclear power, nuclear security and materials safeguard, academia and research, environmental management, and health physics.
ORTEC high and medium resolution handheld radioisotope identifiers (RIIDs) with high sensitivity crystals and intelligent algorithms, provide speed, accuracy and ease of use when detecting and identifying radioisotopes.
The XR-100, X-123 and OEM elements are offered with FastSDD®, standard SDD, Si-PIN and CdTe detectors. The Experimenter’s Kit with X-123FastSDD® is your quick start to best results.
The ORTEC Profile Series of P-Type High Purity Germanium (HPGe) detectors match the crystal dimensions to specific applications for optimal counting geometry and measurement results.
ORTEC utilizes SunPower’s cutting-edge cryocooling technology for HPGe detectors incorporating LN2 recycling or electromechanical cooling to provide premium resolution.
The GAMMA-RAD5 is a powerful, portable gamma-ray spectrometer combining a complete NaI Scintillation Probe with a Digital Pulse Processor providing high quality detection and spectroscopic information.
DP5 is a high performance DPP optimized for OEMs and lab users. DP5-X is a smaller lower power version of the DP5. The DP5G Kit is designed for use in scintillation spectroscopy systems.
The SunPower CryoTel 1.5 cryocooler features a dual-opposed-piston pressure wave generator and a separate cold head to minimize exported vibration and acoustic noise, offering maximum efficiency, reliability and performance.
Compromising nothing in performance, the MCA-8000D is a low power, light weight instrument which is exceptionally versatile and easy to use.
The Mini-X is the first of its kind; a self-contained, packaged, miniature X-ray tube system, which includes the X-ray tube, the power supply, the control electronics and the USB communication to the computer. See also the Mini-X-OEM version.
Get the best performance with solid state detectors, proportional counters, photodiodes, PM tubes, CEMs, or MCPs by using Amptek Charge Sensitive Preamplifiers.
Custom Image Sensor & IC Design Services: Architecture Study, Technology & Specification Development, Circuit Design & Layout, Parasitic Extraction & Verification, and Tapeout to Foundry.
Integrated Production Services: Electro/Optical Test, Prototype & Wafer Probe Development, Qualification, Yield Optimization, and Production Test & Delivery
The Phantom cameras designed for scientific research include a variety of features and extras that ensure the needs of researchers, scientists, and engineers are met. With high-speed and high-resolution capabilities detailed information such as range data and exact measurements can be captured.
Media Production situations require specific features when capturing high-speed imaging. Phantom cameras deliver the resolutions and speeds necessary to produce cinema quality images. The v2640 ONYX is the world's fastest full HD resolution media camera capable of up to 12,500 fps, while the Flex4K delivers the 4K resolution, high-speed imaging that is becoming a media standard.
The K3® camera is the complete and latest expression of Gatan’s deep experience in the delivery of real-time, single-electron counting direct detection cameras for the most demanding low-dose electron microscopy applications.
The world’s first counting, high-speed, large-format camera for in-situ microscopy. Extending the resolution revolution from K3 into material science, you can now count single electrons in real-time with an unprecedented temporal resolution to collect the ultimate in-situ data.
Our digital imaging technology services provide the ability to create custom sensors, perform diagnostic testing, and do production testing.
Our high-speed digital imaging cameras capture extremely fast moving events in industries such as ballistic studies, crash testing, and TV and film productions for "When it's too fast to see, and too important not to!"
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