The CAMECA EIKOS provides accessibility to Atom Probe Tomography with ease of use and a low cost of ownership, enabling new understanding of materials for research and faster development of products for metallurgical applications.
The SPECTRO ARCOS high-resolution ICP-OES spectrometer — designed for use in the most demanding elemental analysis applications in industry, science, and academia — offers fast and convenient selection of axial plasma or radial plasma observation in a single instrument.
The Astrum is designed to test high purity materials with the best detection limits. The primary application of the Astrum GD-MS is the characterisation of high purity conductive and non-conductive materials.
The game changing advancements in the Octane Elite SDD Series take detector technology to the next level. This line of detectors incorporates a new silicon nitride (Si3N4) window, which offers remarkable improvements in low energy sensitivity, light element detection, and low kV microanalysis.
Signal Recovery's lock-in amplifiers recover signals in the presence of overwhelming background noise or can provide high resolution measurements of relatively clean signals over several orders of magnitude and frequency.
The Attom ES from is a double focussing inductively coupled plasma mass spectrometer that has been purpose designed to be the ultimate tool for rapid and precise isotope ratio and quantitative analysis of trace elements in solid and liquid matrices.
The SPECTRO XEPOS energy dispersive X-ray fluorescence (ED-XRF) spectrometer excels at critical tasks from rapid screening elemental analysis for environmental and waste sampling to demanding applications in research, academia, and geological science.
The CAMECA IMS 1300-HR³ is a new generation Ultra High Sensitivity SIMS offering unmatched analytical performance for stable isotope, trace element and small particle analysis in geo- and cosmochemistry, geochronology and nuclear safeguards.
The high-speed and high-sensitivity Hikari EBSD Camera Series is the next generation in electron backscatter diffraction (EBSD) cameras offering outstanding performance across the complete range of EBSD applications. With Hikari cameras, users no longer need to decide between speed and sensitivity.
Plasma 3 is designed to provide the best possible precision and accuracy for simultaneous isotopic ion detection. The patented Zoom Lens enables the simultaneous measurement of the isotopes of elements from lithium to the actinide series.
The market leading mobile metal analyzer SPECTROTEST is the perfect choice for many applications in the metal producing, processing, and recycling industries — especially when exact metal analysis is required, when materials are difficult to identify or when there is a large number of samples to be tested.
The CAMECA NanoSIMS 50L is a high sensitivity ion microprobe with 50nm spatial resolution for a wide application spectrum: intra-cellular metabolic activity measurements in micro-organisms or human cells, isotopic analysis of sub-micron grains in cosmic dust, trace element imaging in nanotechnology.
The SPECTRO xSORT family of handheld ED-XRF spectrometers supplies elemental testing and spectrochemical analysis of myriad materials in widely varying conditions. They offer metals or nonmetals identification in seconds and provide repeatable, laboratory-quality results.
The Noblesse HR has the ability to determine the isotope ratios of the noble gases with accuracy, flexibility and reliability. Noblesse HR can resolve most isobaric interferences to the noble gases, giving more accurate results.
With minimal sample preparation and no coating required, Orbis Micro-XRF Analyzers incorporate fast, simultaneous multi-element X-ray detection with the sensitivity to analyze from parts-per-million to 100% concentrations. Users can conduct elemental analysis on small samples, such as particles, fragments, and inclusions, or automated multi-point and imaging analysis on larger samples, with all of the benefits and simplicity of an XRF analyzer.
The EX-300 semiconductor metrology tool performs in-line process control (composition, thickness) with high throughput and reliability, supporting innovation at the latest nodes. It accelerates the time to market of nanotechnology devices and ensures high production yields.
The SPECTROLAB Arc/Spark optical emission spectrometers for high-performance metal analysis are ideally suitable for metals industry research and development (R&D) and process/quality control.
The Perspective geometry forms the basis for two state of the art IRMS instruments. Designed for flexibility, high performance and reliability, it has the ability to achieve precise measurements from the smallest sample.
Solartron Analytical provides optimized systems for testing the combined electrical, thermal, and mechanical properties of insulators, dielectrics, and electronic materials.
The CAMECA SXFive EPMA performs precise quantitative microanalysis and x-ray mapping of major and trace elements at high spatial resolution in geochemistry, mineralogy, physical and nuclear metallurgy, material sciences (including cements, glass, ceramics …).
The SMX-ILH XRF system is a process control and yield management platform that offers integrated and remote module configurations for in-line atmospheric analysis of coating composition and thickness measurements of rigid and flexible substrates. This system allows the movement of coated material through the measuring enclosure for full panel analysis either in static or across the gradient locations through a motorized, programmable single or dual integrated measuring module.
TIMS is a Thermal Ionisation Mass Spectrometer. The instrument has been developed using our field-proven variable dispersion multi-collector technology to improve the versatility and overall performance of this long established analytical technique.
The Octane Elect Silicon Drift Detector is tailored for users who need higher performance and more options than those offered by entry-level detectors. It offers both increased functionality and high resolution at an optimal value. The Octane Elect SDDs provide remarkable improvements in low energy sensitivity for light element detection and low kV microanalysis.
Our analytical systems include elemental analysis systems for bulk, micro and nanoscale applications as well as structural analysis & visualization systems and energy storage and test analyzers.
Our technologies, products, and services are instrumental in materials analysis for radioisotopic content. Key industry segments include nuclear power, nuclear security and materials safeguard, academia and research, environmental management, and health physics.
ORTEC high and medium resolution handheld radioisotope identifiers (RIIDs) with high sensitivity crystals and intelligent algorithms, provide speed, accuracy and ease of use when detecting and identifying radioisotopes.
The XR-100, X-123 and OEM elements are offered with FastSDD®, standard SDD, Si-PIN and CdTe detectors. The Experimenter’s Kit with X-123FastSDD® is your quick start to best results.
The ORTEC Profile Series of P-Type High Purity Germanium (HPGe) detectors match the crystal dimensions to specific applications for optimal counting geometry and measurement results.
ORTEC utilizes SunPower’s cutting-edge cryocooling technology for HPGe detectors incorporating LN2 recycling or electromechanical cooling to provide premium resolution.
The GAMMA-RAD5 is a powerful, portable gamma-ray spectrometer combining a complete NaI Scintillation Probe with a Digital Pulse Processor providing high quality detection and spectroscopic information.
DP5 is a high performance DPP optimized for OEMs and lab users. DP5-X is a smaller lower power version of the DP5. The DP5G Kit is designed for use in scintillation spectroscopy systems.
The SunPower CryoTel 1.5 cryocooler features a dual-opposed-piston pressure wave generator and a separate cold head to minimize exported vibration and acoustic noise, offering maximum efficiency, reliability and performance.
Compromising nothing in performance, the MCA-8000D is a low power, light weight instrument which is exceptionally versatile and easy to use.
The Mini-X is the first of its kind; a self-contained, packaged, miniature X-ray tube system, which includes the X-ray tube, the power supply, the control electronics and the USB communication to the computer. See also the Mini-X-OEM version.
Get the best performance with solid state detectors, proportional counters, photodiodes, PM tubes, CEMs, or MCPs by using Amptek Charge Sensitive Preamplifiers.
Custom Image Sensor & IC Design Services: Architecture Study, Technology & Specification Development, Circuit Design & Layout, Parasitic Extraction & Verification, and Tapeout to Foundry.
Integrated Production Services: Electro/Optical Test, Prototype & Wafer Probe Development, Qualification, Yield Optimization, and Production Test & Delivery
The Phantom cameras designed for scientific research include a variety of features and extras that ensure the needs of researchers, scientists, and engineers are met. With high-speed and high-resolution capabilities detailed information such as range data and exact measurements can be captured.
Media Production situations require specific features when capturing high-speed imaging. Phantom cameras deliver the resolutions and speeds necessary to produce cinema quality images. The v2640 ONYX is the world's fastest full HD resolution media camera capable of up to 12,500 fps, while the Flex4K delivers the 4K resolution, high-speed imaging that is becoming a media standard.
Our digital imaging technology services provide the ability to create custom sensors, perform diagnostic testing, and do production testing.
Our high-speed digital imaging cameras capture extremely fast moving events in industries such as ballistic studies, crash testing, and TV and film productions for "When it's too fast to see, and too important not to!"